An addition to the methods of test determination for fault detection in combinational circuits

Cvetković, Ljubomir: An addition to the methods of test determination for fault detection in combinational circuits. Acta cybernetica, (16) 4. pp. 545-566. (2004)

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Abstract

We propose a procedure for determining fault detection tests for single and multiple fault in combinational circuits. The stuck-at-fault model is used. By the proposed procedure all test vectors for single and multiple stuck-at-fault in combinational circuit are determined. The path sensitization method is used in the test signal propagation while test signals are defined on a four element set. The procedure can also be applied to the fault detection in programmable logic devices. We consider two-level combinational circuits which are realized by the PAL architecture and we propose a procedure for determining a test set which detects all single stuck-at-faults. As a mathematical tool, the cube theory is used.

Item Type: Article
Journal or Publication Title: Acta cybernetica
Date: 2004
Volume: 16
Number: 4
Page Range: pp. 545-566
ISSN: 0324-721X
Language: angol
Uncontrolled Keywords: Természettudomány, Informatika
Additional Information: Bibliogr.: p. 565-566.; Abstract
Date Deposited: 2016. Oct. 15. 12:25
Last Modified: 2018. Jun. 06. 13:15
URI: http://acta.bibl.u-szeged.hu/id/eprint/12740

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