Cvetković Ljubomir: An addition to the methods of test determination for fault detection in combinational circuits. In: Acta cybernetica, (16) 4. pp. 545-566. (2004)
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Abstract
We propose a procedure for determining fault detection tests for single and multiple fault in combinational circuits. The stuck-at-fault model is used. By the proposed procedure all test vectors for single and multiple stuck-at-fault in combinational circuit are determined. The path sensitization method is used in the test signal propagation while test signals are defined on a four element set. The procedure can also be applied to the fault detection in programmable logic devices. We consider two-level combinational circuits which are realized by the PAL architecture and we propose a procedure for determining a test set which detects all single stuck-at-faults. As a mathematical tool, the cube theory is used.
| Item Type: | Article |
|---|---|
| Journal or Publication Title: | Acta cybernetica |
| Date: | 2004 |
| Volume: | 16 |
| Number: | 4 |
| ISSN: | 0324-721X |
| Page Range: | pp. 545-566 |
| Language: | English |
| Place of Publication: | Szeged |
| Related URLs: | http://acta.bibl.u-szeged.hu/38518/ |
| Uncontrolled Keywords: | Számítástechnika, Nyelvészet - számítógép alkalmazása |
| Additional Information: | Bibliogr.: p. 565-566. ; összefoglalás angol nyelven |
| Subjects: | 01. Natural sciences 01. Natural sciences > 01.02. Computer and information sciences |
| Date Deposited: | 2016. Oct. 15. 12:25 |
| Last Modified: | 2022. Jun. 15. 10:06 |
| URI: | http://acta.bibl.u-szeged.hu/id/eprint/12740 |
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