C.P.D. measurements on oxidized silicon surfaces

Süli Árpád and Michailovits Lehel: C.P.D. measurements on oxidized silicon surfaces. In: Acta physica et chemica, (18) 1-2. pp. 27-37. (1972)

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Item Type: Article
Journal or Publication Title: Acta physica et chemica
Date: 1972
Volume: 18
Number: 1-2
ISSN: 0001-6721
Page Range: pp. 27-37
Language: English
Related URLs: http://acta.bibl.u-szeged.hu/39329/
Uncontrolled Keywords: Természettudomány, Kémia, Fizika
Additional Information: Bibliogr.: 36. p.; Ismertetett mű: A. Šyli-L. Mihajlovič: Izmereniâ C.P.D. na poverhnosti oksidirovannogo kermniâ
Date Deposited: 2016. Oct. 17. 09:26
Last Modified: 2021. Jun. 01. 15:36
URI: http://acta.bibl.u-szeged.hu/id/eprint/23802

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