Süli Árpád and Michailovits Lehel and Hevesi Imre: Determination of the thickness and the refractive index of V2O5 thin films from reflectance interference spectra. In: Acta physica et chemica, (25) 1-2. pp. 29-41. (1979)
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| Item Type: | Article |
|---|---|
| Journal or Publication Title: | Acta physica et chemica |
| Date: | 1979 |
| Volume: | 25 |
| Number: | 1-2 |
| ISSN: | 0001-6721 |
| Page Range: | pp. 29-41 |
| Language: | English |
| Related URLs: | http://acta.bibl.u-szeged.hu/39349/ |
| Uncontrolled Keywords: | Természettudomány, Kémia, Fizika |
| Additional Information: | Bibliogr.: 41. p.; Ismertetett mű: A. Šûli-L. Mihajlovič-I. Heveši: Opredelenie tolŝiny i koèfficenta prelomleniâ tonkih sloev V2O5 na osnovanii otrožatel'nyh interferencionnyh spektrov |
| Date Deposited: | 2016. Oct. 17. 09:25 |
| Last Modified: | 2021. Jun. 01. 13:23 |
| URI: | http://acta.bibl.u-szeged.hu/id/eprint/24114 |
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