Determination of the thickness and the refractive index of V2O5 thin films from reflectance interference spectra

Süli, Árpád and Michailovits, Lehel and Hevesi, Imre: Determination of the thickness and the refractive index of V2O5 thin films from reflectance interference spectra. Acta physica et chemica, (25) 1-2. pp. 29-41. (1979)

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Item Type: Article
Journal or Publication Title: Acta physica et chemica
Date: 1979
Volume: 25
Number: 1-2
Page Range: pp. 29-41
ISSN: 0001-6721
Language: angol
Uncontrolled Keywords: Természettudomány, Kémia, Fizika
Additional Information: Bibliogr.: 41. p.; Ismertetett mű: A. Šûli-L. Mihajlovič-I. Heveši: Opredelenie tolŝiny i koèfficenta prelomleniâ tonkih sloev V2O5 na osnovanii otrožatel'nyh interferencionnyh spektrov
Date Deposited: 2016. Oct. 17. 09:25
Last Modified: 2016. Oct. 17. 09:25
URI: http://acta.bibl.u-szeged.hu/id/eprint/24114

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