Optical properties of SnO2 film

Rus Florina Stefania and Herklotz Andreas and Sebarchievici Iuliana and Iorga Mirela: Optical properties of SnO2 film.

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A SnO2 epitaxial thin film with thicknes of 25 nm is grown by the PLD technique on a (111) orientated SrTiO3 (STO) substrate. The effects of epitaxial growth on the lattice structure, microstructure and optical properties of oxide thin film has been studied. The film is out-of-plane epitaxial oriented to the substrate. The XRD difractograms show only tin dioxide peaks which can be assigned to the (002) and (004) reflexes of the tin dioxide phase. The thickness of the film is calculated from the distance of X-ray reflectivity oscillations. The observation of clear thickness fringes is an indication for a low surface roughness of the film. Atomic force microscopy (AFM) was also used to investigate the surface of the films. AFM images reveal a film surface that shows a flat film surface. Variable angle spectroscopic ellipsometry (VASE) has been used to determine the optical properties of the SnO2 film.

Item Type: Conference or Workshop Item
Journal or Publication Title: Proceedings of the International Symposium on Analytical and Environmental Problems
Date: 2017
Volume: 23
ISBN: 978-963-306-563-1
Page Range: pp. 185-190
Event Title: International Symposium on Analytical and Environmental Problems (23.) (2017) (Szeged)
Related URLs: http://acta.bibl.u-szeged.hu/55894/
Uncontrolled Keywords: Elektrokémia
Additional Information: Bibliogr.: 190. p. ; összefoglalás angol nyelven
Date Deposited: 2018. Dec. 14. 11:46
Last Modified: 2022. Aug. 08. 15:49
URI: http://acta.bibl.u-szeged.hu/id/eprint/56185

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