%P 545-566 %C Szeged %O Bibliogr.: p. 565-566. ; ĂśsszefoglalĂĄs angol nyelven %T An addition to the methods of test determination for fault detection in combinational circuits %J Acta cybernetica %A CvetkoviÄ Ljubomir %N 4 %D 2004 %L acta12740 %K SzĂĄmĂtĂĄstechnika, NyelvĂŠszet - szĂĄmĂtĂłgĂŠp alkalmazĂĄsa %V 16 %X We propose a procedure for determining fault detection tests for single and multiple fault in combinational circuits. The stuck-at-fault model is used. By the proposed procedure all test vectors for single and multiple stuck-at-fault in combinational circuit are determined. The path sensitization method is used in the test signal propagation while test signals are defined on a four element set. The procedure can also be applied to the fault detection in programmable logic devices. We consider two-level combinational circuits which are realized by the PAL architecture and we propose a procedure for determining a test set which detects all single stuck-at-faults. As a mathematical tool, the cube theory is used.