TY  - CONF
N1  - Bibliogr.: 190. p. ; összefoglalás angol nyelven
EP  - 190
SP  - 185
SN  - 978-963-306-563-1
A1  -  Rus Florina Stefania
A1  -  Herklotz Andreas
A1  -  Sebarchievici Iuliana
A1  -  Iorga Mirela
Y1  - 2017///
AV  - public
ID  - acta56185
T2  - International Symposium on Analytical and Environmental Problems (23.) (2017) (Szeged)
N2  - A SnO2 epitaxial thin film with thicknes of 25 nm is grown by the PLD technique on a (111) orientated SrTiO3 (STO) substrate. The effects of epitaxial growth on the lattice structure, microstructure and optical properties of oxide thin film has been studied. The film is out-of-plane epitaxial oriented to the substrate. The XRD difractograms show only tin dioxide peaks which can be assigned to the (002) and (004) reflexes of the tin dioxide phase. The thickness of the film is calculated from the distance of X-ray reflectivity oscillations. The observation of clear thickness fringes is an indication for a low surface roughness of the film. Atomic force microscopy (AFM) was also used to investigate the surface of the films. AFM images reveal a film surface that shows a flat film surface. Variable angle spectroscopic ellipsometry (VASE) has been used to determine the optical properties of the SnO2 film.
UR  - http://acta.bibl.u-szeged.hu/56185/
KW  - Elektrokémia
TI  - Optical properties of SnO2 film
VL  - 23
ER  -